R-Inspecscopy is developed for measuring reflective object. Single Image Reconstruction Digital Holography algorithm, which is our company’s individual software, is embedded in R-Inspecscopy. R-Inspecscopy is designed with optimized hardware system for better lateral and longitudinal (axial) accuracies. Also, possible to customize the R-Inspecscopy in various types, and provide optimized products to our customers.
Minimize hardware volume
Minimize noise & 
Single image & 
Parallel processing 
Customize hardware system
High precision
Robust system
Real-time processing
No pre-process| Models | NR-INS5 | NR-INS20 | NR-INS50 | NR-INS100 | 
|---|---|---|---|---|
| Light source | Single wavelength LASER | |||
| Pixel size | 7.4μm | |||
| Objective lens | 5x NA 0.14 | 20x NA 0.29 | 50x NA 0.42 | 100x NA 0.55 | 
| Axial resolution | 2.47nm (Theoretical) | |||
| Field of view | 3.0mm x 3.0mm | 0.76mm x 0.76mm | 0.3mm x 0.3mm | 0.15mm x 0.15mm | 
| Working distance | 34mm | 20mm | 13mm | 6mm | 
| Bit depth | 8-bits | |||
| Imaging speed | 15 fps (Max. 50 fps) | |||
| Sample preparation | No labeling | |||
| Output data | 1D, 2D, 3D, 4D, Hologram analyze data | |||
The specifications mentioned above can be changed according to the customer's request.
							If you would like a customized specification, please contact contact@naeilhae.com
                                    Display panel inspection
                                
                                    Semiconductor inspection 
                                
                                    PCB inspection
                                
                                    Solar cell inspection
                                
                                    Steel inspection
                                
                                    Reflective components analysis